Software Reliability

Advantages of IEEE P1633 for Practicing Software Reliability

DavidH · Apr 7, 2016 · Leave a Comment

May 4, 2016 FREE RELIABILITY WEBINAR - "Advantages of IEEE P1633 for Practicing Software Reliability" Host: Ops A La Carte Speaker: Ann Marie Neufelder, Founder, SoftRel LLC Date: May 4, 2016 Time: 12:00pm-1:00pm Pacific Time Register: https://attendee.gotowebinar.com/register/8970286823844085251 Software reliability engineering has existed for almost 50 years. Software reliability metrics such as failure rate, MTBF, availability and reliability have been used successfully in industry to plan, manage and demonstrate the achievement of system reliability objectives. The newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses during any phase of software or firmware development …

IEEE Santa Clara Valley Reliability Chapter Meeting

DavidH · Mar 2, 2016 · Leave a Comment

March 3, 2016 Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab Title: Physics- based life distribution and reliability modeling of solid state drives Invited Speaker: Dr. Alexander Parkhomovsky, Ph.D., Engineering Development Manager at Lumentum Date: Thursday, March 3, 2016 Time: Check in and food at 6:00PM - 6:30 PM. Presentation from 6:30 PM to 7:30 PM Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B) Admission: Open to all IEEE members and non-members Abstract: The model of solid state drive (SSD) life time distribution from physics-based life model considering the random nature of real world customer data usage and product inherent physical properties is developed. The talk is focused on the …

The Power of Population in Semiconductor Device Reliability

George Denes · Nov 9, 2012 · Leave a Comment

When we introduce a new chip, we plan and execute a comprehensive reliability qualification plan. This plan will be based on many different reliability stresses addressing infant mortality rate test, early life failure rate test, long term life test failure rate prediction based on a small population of samples pulled from early production lots . Due to the fact of limited device sample sizes, we are trying to assign a confidence level to our failure rate predictions using "industry standard" chi-square adjustment in the hope, our prediction will be closer to real field failure rates. This is a "standard" approach of the semiconductor industry because testing very large sample sizes of chips is economically not feasible, especially for small-and fabless semiconductor companies. IBM Corp.'s …

Function Point Analysis in Software Development

Rich Fries · Aug 20, 2012 · Leave a Comment

Function Point Analysis (FPA) has been proven as a reliable method for measuring the size of computer software. First made public by Allan Albrecht of IBM in 1979, the FPA technique quantifies the functions contained within software in terms that are meaningful to the software users. It can be readily applied across a wide range of development environments and throughout the life of a development project, from early requirements definition to full operational use. In addition to measuring output, Function Point Analysis is extremely useful in estimating projects, managing change of scope, measuring productivity, and communicating functional requirements. The Function Point Analysis technique provides an objective, comparative measure that assists in the evaluation, planning, management …

Reliability Lab Testing, Consulting, Training.

Software Reliability

Advantages of IEEE P1633 for Practicing Software Reliability

IEEE Santa Clara Valley Reliability Chapter Meeting

The Power of Population in Semiconductor Device Reliability

Function Point Analysis in Software Development

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