Reliability Training

Certified Reliability Engineer (CRE) Preparation Course for Fall 2016

DavidH · May 5, 2016 · 2 Comments

August / September 2016 Certified Reliability Engineer (CRE) Preparation Course for Fall 2016 - Registration Is Open!! Date(s): Tentatively starting in August 2016 and running through the end of September 2016; ASQ CRE Exam is scheduled for Oct 1, 2016 Time: 3:00pm-7:00pm Pacific time Instructor: Les Warrington Length: 8 sessions Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed. Location: Via webinar Exam Application Deadline: August 12, 2016 Becoming certified as a Reliabililty Engineer (CRE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth …

Advantages of IEEE P1633 for Practicing Software Reliability

DavidH · Apr 7, 2016 · Leave a Comment

May 4, 2016 FREE RELIABILITY WEBINAR - "Advantages of IEEE P1633 for Practicing Software Reliability" Host: Ops A La Carte Speaker: Ann Marie Neufelder, Founder, SoftRel LLC Date: May 4, 2016 Time: 12:00pm-1:00pm Pacific Time Register: https://attendee.gotowebinar.com/register/8970286823844085251 Software reliability engineering has existed for almost 50 years. Software reliability metrics such as failure rate, MTBF, availability and reliability have been used successfully in industry to plan, manage and demonstrate the achievement of system reliability objectives. The newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses during any phase of software or firmware development …

Conducting Effective Design Verification Testing (DVT)

DavidH · Apr 4, 2016 · Leave a Comment

April 6, 2016 FREE RELIABILITY WEBINAR - "Conducting an Effective DVT" Host: Ops A La Carte Speaker: Gerry Cohen, Senior Reliability Engineer Date: April 6, 2016 Time: 12:00pm-1:00pm Pacific Time Register: https://attendee.gotowebinar.com/register/1255349082256235777 A Design Verification Testing (DVT) is usually an integral part of many technology provider’s qualification process. But how effective is it in light of design, manufacturing, suppliers and customers? This webinar will explore several methods and tools useful in conducting DVT. To Register and for more info, please call 408.654.0499, x203 We look forward to seeing you at all of our events! Jay and all the Ops Staff …

Certified Quality Engineer (CQE) Preparation Course First Session

DavidH · Feb 29, 2016 · Leave a Comment

April 6, 2016 Date(s): Tentatively one session per week starting April 6, 2016, through Jun 1, 2016; ASQ CRE Exam is scheduled for Jun 4, 2016 Time: 3:00pm-7:00pm Pacific time Instructor: Greg Swartz and Pat McMahon Length: 9 sessions Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed. Location: Via webinar Becoming certified as a Quality Engineer (CQE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Quality Engineering, this can benefit you substantially. To Register and for more info, please call 408.654.0499, x203 We look forward to …

IEEE Santa Clara Valley Reliability Chapter Meeting

DavidH · Jul 28, 2015 · Leave a Comment

August 6, 2015 Food sponsored by ICE Labs, ISO 9001 & 17025 Reliability Test Lab Title: Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability Invited Speaker: Souvik Mahapatra, Professor of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India Time: Check in and food at 6:00PM - 6:30 PM Presentation from 6:30 PM to 7:30 PM Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria) (View Map) Admission: Open to all IEEE members and non-members for FREE! Abstract: Negative Bias Temperature Instability (NBTI) is a crucial reliability concern for modern day state-of-the-art CMOS technologies. NBTI results in shift in MOSFET parameters, such as threshold voltage, drain current, etc., over time, and …

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