DRAM Technical Paper DRAM Soft Errors - White Paper 2010 - Charle Slayman - Paper by Charlie Slayman, Ph.D., Ops A La Carte LLC What are soft errors and what causes them? As IC device technology scales to smaller and smaller feature sizes, the subject of soft errors is gaining importance in the design of reliable systems. A soft error is the upset in memory, static logic or combinational logic. The term "soft" is used because the upset is not due to any permanent damage of the circuit. If the error can be detected and corrected, the device can be returned to its proper operating condition without any service intervention. …
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ART Technical Paper
ART Technical Paper Accelerated Reliability Test Techniques Used to Find Defects in Circuit Boards 1998 - Mike Silverman - Paper Introduction The customer was experiencing a high falloout rate in manufacturing test and in the field due to PCB related problems. The testing was performed at the completed assembly level using production samples. All products were tested on a QualMark OVS-2.5HP combined OmniAxial™ Vibration and UltraRate™ Thermal System. The input vibration consisted of broadband energy from 2 to 10 kHz measured in Grms on the product …
HALT Technical Papers
HALT Technical Paper From HALT results to an Accurate Field MTBF, the HALT Calculator - RAMS 2010 - Harry McLean and Mike Silverman - Paper Summary & Conclusions As HALT takes only a few days to run and to implement its corrective action(s), and even if it takes a bit longer, this time would be far less than waiting for an RT to be run and to implement its corrective action(s). This paper discusses a mathematical model which can be a huge time and cost saver. By not performing life tests and simply doing an effective HALT, time and money will be saved. Field Failure Rate Estimate from HALT Results - 2008 - Harry McLean - Paper Overview of AFR Estimator The AFR Estimator is a patent pending mathematical model that, when provided with the appropriate HALT and product information,, will …
ALT Technical Paper
ALT Technical Paper How to Select the Right Accelerated Life Test Approach Paper - RAMS 2012 - Fred Schenkelberg - Paper Over the many years of development concerning accelerated life testing (ALT), our peers have found many ways to take advantage of the interaction of stress and failure mechanisms [1-15]. In an ideal situation, the reliability engineer will have ample time, samples, test resources and knowledge to conduct an ALT. This is often not the case. Trading off the risks in conducting the ALT and fitting within the myriad of constraints and expectations is a challenge. Understanding the basics of ALT approaches and associated assumptions, permits one to select the right ALT. 'Right' being the ALT that provides meaningful results in time for technical and business decisions, plus …
Tech Shorts
The Computable Document Format (CDF) is powering the next generation of interactive documents, blogs, reports, presentations, articles, books, courseware, and more. It works the same way as the Adobe PDF reader which everyone is used to using. It's a simple download and from there the plug-in will work on it's own without further intervention on your part. You can download the Wolfram CDF Player Here or when you are prompted when viewing our Tech Shorts Tech Shorts Exponential The exponential distrubition is the simplest distribution used in life data analysis. The distribution applies in very few situations, yet is widely used due to its simplicity. Exponential Reliability Function Exponential Hazard Rate Function Exponential Probability Density Function Exponential Reliability …
